Enabling Discovery Through High-Resolution Imaging

The Center for Microscopic Imaging and Analysis (CMIA) is a multi-user, shared instrumentation facility that provides access to advanced structural and chemical analysis, materials characterization, and imaging techniques.

CMIA supports faculty, students, and industrial partners with state-of-the-art instrumentation, including:

• Atomic Force Microscopy (AFM)
• Scanning Electron Microscopy (SEM)
• X-ray Diffraction (XRD)
• X-ray Microanalysis (EDS)
• Thermal Materials Characterization (DSC/TGA)
• Optical Microscopy