Descriptions and Instructions

The Center for Microscopic Imaging and Analysis (CMIA) houses a variety of imaging and analysis tools to provide a resource for not only our university, but also the community. St. Cloud State University’s CMIA allows for open access to some of today’s top microscopic imaging and analysis equipment.

atomic force microscopy

Asylum Research - website

Atomic Force Microscope
on an Inverted Fluorescent optical microscope

Model - Asylum Research MFP-3D Bio on top of a Nikon TE-2000

Capabilities - Height, Conductive, Magnetic and Fluorescent Data

Operations Manual - version 04.08 (38 mb)

Procedural Manual
- Beta version 10 (May 2009- 33 mb)


scanning electron microscope with x-ray detector eds system

JEOL USA - website

Scanning Electron Microscope with X-ray Detector EDS system

Model - JEOL 6060LV with Thermo Fischer Sci Noran System Six EDS

Capabilities - Image and X-ray data

About SEM (11 mb)

SEM Basic Knowledge (1 mb)

SEM Q & A (1 mb)

Scanning Microscope Observation (1 mb)

x-ray diffractor


X-Ray Diffraction

Model - Bruker D8 Discover

Sputter Coater

Sputter Coater with Carbon Accessory for Thermal Deposition

Model - Denton Vacum Desk IV

Capabilities - Gold, Silver, Gold Paladium targets with thickness monitor


Differential Scanning Calirometer

Differential Scanning Calorimeter (DSC)

DSC is a thermoanalytical technique in which the difference in the amount of heat required to increase the temperature of a sample and reference is measured as a function of temperature.

TGA 550

Thermogravimetric Analyzer (TGA)

TGA is commonly used to determine selected characteristics of materials that exhibit either mass loss or gain due to decomposition, oxidation, or loss of volatiles (such as moisture).