Center for Microscopic Imaging and Analysis

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CMIA

The Center for Microscopic Imaging and Analysis (CMIA) is a multi-user, shared instrumentation facility that provides access to modern structural and chemical analysis, materials characterization and imaging techniques. 

It supports faculty, students and industrial partners with advanced instrumentation including:

  • Atomic Force Microscopy (AFM)
  • Scanning Electron Microscopy (SEM)
  • X-ray Diffraction (XRD)
  • X-ray microanalysis (EDS)
  • Thermal materials characterization (DSC/TGA)
  • Optical microscopy