The Center for Microscopic Imaging and Analysis (CMIA) is a multi-user, shared instrumentation facility that provides access to modern structural and chemical analysis, materials characterization and imaging techniques.
It supports faculty, students and industrial partners with advanced instrumentation including:
- Atomic Force Microscopy (AFM)
- Scanning Electron Microscopy (SEM)
- X-ray Diffraction (XRD)
- X-ray microanalysis (EDS)
- Thermal materials characterization (DSC/TGA)
- Optical microscopy