The Center for Microscopic Imaging and Analysis (CMIA) provides access to modern structural and chemical analysis techniques.
Instrumentation available at the Center includes a scanning electron microscope (SEM) with EDS x-ray capabilities, an atomic force microscope (AFM) and an inverted fluorescence microscope.
The SEM, with EDS capabilities, provides analytical materials characterization with x-ray microanalysis. The SEM is also equipped with a low vacuum mode which allows for observation of specimens that cannot normally be viewed at high vacuum due to samples with excessive water content or samples with non-conductive surfaces.
The AFM has been interfaced to an inverted fluorescence microscope to allow for imaging of biological samples. A closed fluid cell is available for imaging in fluids. The AFM is also equipped to provide electrical conductivity and magnetic force imaging of surfaces.