AFM height image

AFM height images of several Cyciotella meneghiniana

The Center for Microscopic Imaging and Analysis (CMIA) provides access to modern structural and chemical analysis techniques.

Instrumentation available at the Center includes a scanning electron microscope (SEM) with EDS x-ray capabilities, an atomic force microscope (AFM) and an inverted fluorescence microscope.

The SEM, with EDS capabilities, provides analytical materials characterization with x-ray microanalysis. The SEM is also equipped with a low vacuum mode which allows for observation of specimens that cannot normally be viewed at high vacuum due to samples with excessive water content or samples with non-conductive surfaces.

The AFM has been interfaced to an inverted fluorescence microscope to allow for imaging of biological samples. A closed fluid cell is available for imaging in fluids. The AFM is also equipped to provide electrical conductivity and magnetic force imaging of surfaces.