Instrument Access Request Form

User Information





Equipment Information

Instrument Requested

Scanning Electron Microscope
Atomic Force Microscope
Fluorescence Microscope

Project Duration

One-time usage
Short term project (less than two weeks)
Long term, on-going project (greater than two weeks)

Tentative dates/times:

Project description:

Request for Technical Assistance

User requests operator assistance
User will provide operator:
        Nave of Operator:

        Training Level: (See training level description. To return to form use browser's Back button.)

Materials Requested (for sample preparation and analysis)


Multi 75 tips for general purpose in air tapping mode imaging tip $24 Rough samples 1 tip/10 images; Smooth sample 1 tip/25 images; typical day on AFM is about 5-10 images
Biolever tips for in liquid imaging of biological samples and force measurements of biological samples tip $32 Clean sample 1 tip/10 images; Sticky sample 1 tip/3 images; Force measurements ~ 1000 taps; typical day working with samples in fluid is about 5-6 images
Electrilever tips for conductive measurements in contact mode imaging tip $30 Rough sample 1 tip/5 images; Smooth sample 1 tip/10 images; typical day working with conductive samples is about 5-10 images

SEM Materials

Stub Provides a surface to mount sample, can be placed in the sputter coater and then the SEM stub ~$1 Each sample generally required its own stub
Sputter CoatingĀ  AuPd - provides the conductive coating required for imaging samples that are inherintly non-conductive (biological, organic based samples) min. NA Samples generally require between 1.5 and 2 minutes sec. at 50% power
Liquid Nitrogen for cooling th x-ray EDS detector Duer $60 Will provide EDS usage for ~5 days, must get in this quantity because the detector needs to be cooled initially and then topped off daily

Other comments:


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