Instrument Access & User Training

Register

  1. Complete user request form

Scheduling

  1. Atomic Force Microscope
    (login required)
  2. Scanning Electron Microscope
    (login required)

Faculty and Staff

Training required for independent usage by Faculty and Staff:

  • Attended SEM/EDS Manufacturers Training + 7hrs
  • In-house training for SEM/EDS + 15hrs
  • AFM training (on a case by case basis)

Students

SEM

Training Levels Student Type (Description)

Level of Supervision

A

  • Graduate student research assistant/thesis work
  • Extended project (senior thesis)

Unsupervised

B

  • Undergraduate research student working with faculty on short project
  • Graduate student working on short project

Trained faculty/staff
or
Level A student

C

  • Class project (Semester long)

Trained faculty/staff
or
Level A student

         
Student Training Requirements
Level A: (training for students requiring unsupervised usage)

  • Attended SEM/EDS Manufacturers Training + 7hrs supervised usage
  • In-house training for SEM/EDS + 15hrs supervised usage
  • AFM training (on a case by case basis)