The Center for Microscopic Imaging and Analysis (CMIA) provides researchers access to an array of modern nanostructural and nanochemical analysis techniques.

Instrumentation includes scanning electron microscopy with EDS capabilities and a low vacuum mode.  

EDS provides analytical materials characterization with X-ray microanalysis. The low vacuum mode allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because of a non-conductive surface. 

The center is also equipped with an atomic force microscope (AFM) that has been interfaced to an inverted fluorescence microscope.  The AFM is also equipped to allow for electrical conductivity and magnetic force mapping of the surface.